IEEE-EDL paper on ion beam modified Ni-MoS2 contacts
Our work on the improvement of Ni-MoS2 contact interfaces by exposure to a broad-beam ion source has been published in IEEE Electron Device Lett. Check out the paper here.
Our work on the improvement of Ni-MoS2 contact interfaces by exposure to a broad-beam ion source has been published in IEEE Electron Device Lett. Check out the paper here.